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"Test Sequence-Optimized BIST for Automotive Applications."

Bartosz Kaczmarek et al. (2020)

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DOI: 10.1109/ETS48528.2020.9131585

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-22

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  dblp key:
  - conf/ets/KaczmarekM0RRT20
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  persistent URL:
  - https://dblp.org/rec/conf/ets/KaczmarekM0RRT20
Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer:
Test Sequence-Optimized BIST for Automotive Applications. ETS 2020: 1-6

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