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"Test challenges in nanometer technologies."

Sandip Kundu, Sanjay Sengupta, Rajesh Galivanche (2000)

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DOI: 10.1109/ETW.2000.873783

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Sandip Kundu, Sanjay Sengupta, Rajesh Galivanche:
Test challenges in nanometer technologies. ETW 2000: 83-90

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