"A novel delay fault testing methodology using on-chip low-overhead delay ..."

Arijit Raychowdhury et al. (2005)

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DOI: 10.1109/ETS.2005.2

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Arijit Raychowdhury, Swaroop Ghosh, Swarup Bhunia, Debjyoti Ghosh, Kaushik Roy:
A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points. ETS 2005: 108-113

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