"Combining Built-In Redundancy Analysis with ECC for Memory Testing."

Luc Romain et al. (2024)

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DOI: 10.1109/ETS61313.2024.10567190

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-04

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Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim:
Combining Built-In Redundancy Analysis with ECC for Memory Testing. ETS 2024: 1-6

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