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"Test Pattern Generation Under Low Power Constraints."

Fulvio Corno et al. (1999)

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DOI: 10.1007/10704703_13

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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  dblp key:
  - conf/evoW/CornoRRV99
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  - https://dblp.org/rec/conf/evoW/CornoRRV99
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante:
Test Pattern Generation Under Low Power Constraints. EvoWorkshops 1999: 162-170

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