"Using Interleaving to Avoid the Effects of Multiple Adjacent Faults in ..."

Luis J. Saiz-Adalid et al. (2013)

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DOI: 10.1007/978-3-642-38789-0_20

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

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Luis J. Saiz-Adalid, Pedro J. Gil, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo:
Using Interleaving to Avoid the Effects of Multiple Adjacent Faults in On-Chip Interconnection Lines. EWDC 2013: 198-201

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