"Si BJT and SiGe HBT performance modeling after neutron radiation exposure."

Konstantin O. Petrosyants et al. (2011)

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DOI: 10.1109/EWDTS.2011.6116607

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Konstantin O. Petrosyants, Eric Vologdin, Dmitry Smirnov, Rostislav Torgovnikov, Maxim V. Kozhukhov:
Si BJT and SiGe HBT performance modeling after neutron radiation exposure. EWDTS 2011: 267-270

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