"Test Cost Constraint Reduction with Common Cost."

Guiying Pan, Fan Min, William Zhu (2011)

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DOI: 10.1007/978-3-642-27142-7_8

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-20

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Guiying Pan, Fan Min, William Zhu:
Test Cost Constraint Reduction with Common Cost. FGIT 2011: 55-63

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