"Memory block based scan-BIST architecture for application-dependent FPGA ..."

Keita Ito et al. (2014)

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DOI: 10.1145/2554688.2554764

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue:
Memory block based scan-BIST architecture for application-dependent FPGA testing. FPGA 2014: 85-88

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