"A high resolution diagnosis technique for open and short defects in FPGA ..."

Mehdi Baradaran Tahoori (2003)

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DOI: 10.1145/611817.611882

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Mehdi Baradaran Tahoori:
A high resolution diagnosis technique for open and short defects in FPGA interconnects. FPGA 2003: 248

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