"Multiple stuck-at fault testability of self-testing checkers."

Takashi Nanya, Samiha Mourad, Edward J. McCluskey (1988)

Details and statistics

DOI: 10.1109/FTCS.1988.5347

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics