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"Aging-Induced Failure Prognosis via Digital Sensors."
Md Toufiq Hasan Anik et al. (2023)
- Md Toufiq Hasan Anik
, Hasin Ishraq Reefat
, Jean-Luc Danger
, Sylvain Guilley
, Naghmeh Karimi
:
Aging-Induced Failure Prognosis via Digital Sensors. ACM Great Lakes Symposium on VLSI 2023: 703-708

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