"Characterization of monotonic static CMOS gates in a 65nm technology."

Ali Bastani, Charles A. Zukowski (2005)

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DOI: 10.1145/1057661.1057758

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Ali Bastani, Charles A. Zukowski:
Characterization of monotonic static CMOS gates in a 65nm technology. ACM Great Lakes Symposium on VLSI 2005: 408-411

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