"On Test Generation with A Limited Number of Tests."

Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara (1999)

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DOI: 10.1109/GLSV.1999.757366

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara:
On Test Generation with A Limited Number of Tests. Great Lakes Symposium on VLSI 1999: 12-15

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