"Nanometer-scale standard cell library for enhanced redundant via1 ..."

Tsang-Chi Kan et al. (2011)

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DOI: 10.1145/1973009.1973073

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Tsang-Chi Kan, Shih-Hsien Yang, Ting-Feng Chang, Shanq-Jang Ruan:
Nanometer-scale standard cell library for enhanced redundant via1 insertion rate. ACM Great Lakes Symposium on VLSI 2011: 319-324

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