"Design challenges in 45nm and below: DFM, low-power and design for ..."

Philippe Magarshack (2007)

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DOI: 10.1145/1228784.1228785

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Philippe Magarshack:
Design challenges in 45nm and below: DFM, low-power and design for reliability. ACM Great Lakes Symposium on VLSI 2007: 1

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