"Input Pattern Classification for Transistor Level Testing of Bridging ..."

Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya (1996)

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DOI: 10.1109/GLSV.1996.497622

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI 1996: 214-219

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