"Exploratory Power Noise Models of Standard Cell 14, 10, and 7 nm FinFET ICs."

Ravi Patel et al. (2016)

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DOI: 10.1145/2902961.2903035

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-07

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Ravi Patel, Kan Xu, Eby G. Friedman, Praveen Raghavan:
Exploratory Power Noise Models of Standard Cell 14, 10, and 7 nm FinFET ICs. ACM Great Lakes Symposium on VLSI 2016: 233-238

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