"Reliability analysis of power gated SRAM under combined effects of NBTI ..."

Anuj Pushkarna, Hamid Mahmoodi (2010)

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DOI: 10.1145/1785481.1785567

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Anuj Pushkarna, Hamid Mahmoodi:
Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS. ACM Great Lakes Symposium on VLSI 2010: 373-376

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