"Influence of metallic tubes on the reliability of CNTFET SRAMs: error ..."

Zhen Wang, Mark G. Karpovsky, Ajay Joshi (2011)

> Home

Details and statistics

DOI: 10.1145/1973009.1973082

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/glvlsi/WangKJ11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/WangKJ11
Zhen Wang, Mark G. Karpovsky, Ajay Joshi:
Influence of metallic tubes on the reliability of CNTFET SRAMs: error mechanisms and countermeasures. ACM Great Lakes Symposium on VLSI 2011: 359-362

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.