"A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust ..."

Aibin Yan et al. (2021)

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DOI: 10.1145/3453688.3461493

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-21

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Aibin Yan, Aoran Cao, Zhengzheng Fan, Zhelong Xu, Tianming Ni, Patrick Girard, Xiaoqing Wen:
A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments. ACM Great Lakes Symposium on VLSI 2021: 301-306

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