"A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale ..."

Aibin Yan et al. (2022)

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DOI: 10.1145/3526241.3530321

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-03

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Aibin Yan, Zhen Zhou, Shaojie Wei, Jie Cui, Yong Zhou, Tianming Ni, Patrick Girard, Xiaoqing Wen:
A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale CMOS Technology. ACM Great Lakes Symposium on VLSI 2022: 255-260

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