"Simultaneous measurements of metal thickness and defect depth using low ..."

Saibo She et al. (2024)

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DOI: 10.1109/I2MTC60896.2024.10561190

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-23

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Saibo She, Zihan Xia, Xinnan Zheng, Wuliang Yin:
Simultaneous measurements of metal thickness and defect depth using low frequency sweeping eddy current testing. I2MTC 2024: 1-5

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