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"Workload-aware failure prediction method for VLSI devices using an LUT ..."

Zhiming Yang et al. (2018)

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DOI: 10.1109/I2MTC.2018.8409562

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-31

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  dblp key:
  - conf/i2mtc/YangSYZGP18
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  - https://dblp.org/rec/conf/i2mtc/YangSYZGP18
Zhiming Yang, Peng Sun, Yang Yu, Hui Zhang, Guoyu Gao, Xiyuan Peng:
Workload-aware failure prediction method for VLSI devices using an LUT based approach. I2MTC 2018: 1-6

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