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ORCID"A Novel Defect Classification Scheme Based on Convolutional Autoencoder ..."
Jaegyeong Cha, Juyong Park, Jongpil Jeong (2022)
- Jaegyeong Cha, Juyong Park, Jongpil Jeong:
A Novel Defect Classification Scheme Based on Convolutional Autoencoder with Skip Connection in Semiconductor Manufacturing. ICACT 2022: 347-352
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