"Steep coverage-ascent directed test generation for shared-memory ..."

Gabriel A. G. Andrade et al. (2018)

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DOI: 10.1145/3240765.3240852

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-09

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Gabriel A. G. Andrade, Marleson Graf, Nícolas Pfeifer, Luiz C. V. dos Santos:
Steep coverage-ascent directed test generation for shared-memory verification of multicore chips. ICCAD 2018: 29

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