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"VST: A virtual stress testing framework for discovering bugs in SSD ..."

Ren-Shuo Liu, Yun-Sheng Chang, Chih-Wen Hung (2017)

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DOI: 10.1109/ICCAD.2017.8203790

access: closed

type: Conference or Workshop Paper

metadata version: 2018-04-09

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/LiuCH17
Ren-Shuo Liu, Yun-Sheng Chang, Chih-Wen Hung:
VST: A virtual stress testing framework for discovering bugs in SSD flash-translation layers. ICCAD 2017: 283-290

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