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"Design of cross-point metal-oxide ReRAM emphasizing reliability and cost."

Dimin Niu et al. (2013)

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DOI: 10.1109/ICCAD.2013.6691092

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/iccad/NiuXMJX13
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/NiuXMJX13
Dimin Niu, Cong Xu, Naveen Muralimanohar, Norman P. Jouppi, Yuan Xie:
Design of cross-point metal-oxide ReRAM emphasizing reliability and cost. ICCAD 2013: 17-23

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