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"A gate delay model focusing on current fluctuation over wide-range of ..."

Kenichi Shinkai et al. (2006)

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DOI: 10.1145/1233501.1233512

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/ShinkaiHKO06
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/ShinkaiHKO06
Kenichi Shinkai, Masanori Hashimoto, Atsushi Kurokawa, Takao Onoye:
A gate delay model focusing on current fluctuation over wide-range of process and environmental variability. ICCAD 2006: 47-53

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