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"On per-test fault diagnosis using the X-fault model."

Xiaoqing Wen et al. (2004)

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DOI: 10.1109/ICCAD.2004.1382653

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/WenMKWSK04
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/WenMKWSK04
Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita:
On per-test fault diagnosis using the X-fault model. ICCAD 2004: 633-640

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