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"Assessment of False Identity by Variability in Operating Condition for ..."
Ha-Phuong Nguyen et al. (2020)
- Ha-Phuong Nguyen, The-Nghia Nguyen, Nhat-An Nguyen
, SungHyun Park, Yeong-Seok Seo, Dosam Hwang, Donghwa Shin:
Assessment of False Identity by Variability in Operating Condition for Memristor Write Time-Based Device Fingerprints. ICCCI 2020: 631-639
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