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"Estimation of area and performance overheads for testable VLSI circuits."
J. R. Miles, Anthony P. Ambler, K. A. E. Totton (1988)
- J. R. Miles, Anthony P. Ambler, K. A. E. Totton:
Estimation of area and performance overheads for testable VLSI circuits. ICCD 1988: 402-407
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