default search action
"On Test Application Time and Defect Detection Capabilities of Test Sets ..."
Irith Pomeranz, Sudhakar M. Reddy (2000)
- Irith Pomeranz, Sudhakar M. Reddy:
On Test Application Time and Defect Detection Capabilities of Test Sets for Scan Designs. ICCD 2000: 395-400
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.