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"ESD-capability Influences of UHV Circular nLDMOS Transistors by the ..."
Tien-Yu Lan et al. (2020)
- Tien-Yu Lan, Shen-Li Chen, Sheng-Kai Fan, Po-Lin Lin, Yu-Jie Zhou, Shi-Zhe Hong, Hung-Wei Chen:
ESD-capability Influences of UHV Circular nLDMOS Transistors by the Drain-side Ladder-step STI. ICCE-TW 2020: 1-2
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