"ESD-Reliability Investigation 1of an UHV Elliptical LDMOS-SCR ..."

Po-Lin Lin et al. (2019)

> Home

Details and statistics

DOI: 10.1109/ICCE-TW46550.2019.8991941

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icce-tw/LinCWJF19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icce-tw/LinCWJF19
Po-Lin Lin, Shen-Li Chen, Pei-Lin Wu, Yu-Lin Jhou, Sheng-Kai Fan:
ESD-Reliability Investigation ¹of an UHV Elliptical LDMOS-SCR by the Drain-Side Junction Replacement. ICCE-TW 2019: 1-2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.