"Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns."

Hideaki Doi et al. (1995)

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DOI: 10.1109/ICCV.1995.466887

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iccv/DoiSHIFK95
Hideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki:
Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. ICCV 1995: 575-582

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