"New Analog Test Metrics Based on Probabilistic and Deterministic ..."

Abdessatar Abderrahman et al. (2007)

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DOI: 10.1109/ICECS.2007.4510936

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Abdessatar Abderrahman, Mohamad Sawan, Yvon Savaria, Abdelhakim Khouas:
New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches. ICECS 2007: 82-85

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