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"Transient current and delay analysis for resistive-open defects in future ..."

Mohammad Fawaz et al. (2010)

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DOI: 10.1109/ICECS.2010.5724543

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Mohammad Fawaz, Nader Kobrosli, Ahmad Chkeir, Ali Chehab, Ayman I. Kayssi:
Transient current and delay analysis for resistive-open defects in future 16 nm CMOS circuits. ICECS 2010: 438-441

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