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"Mismatch effects explained by the spectral model [MOS devices]."
Jürgen Oehm, Ulrich Grünebaum, Klaus Schumacher (1999)
- Jürgen Oehm
, Ulrich Grünebaum, Klaus Schumacher:
Mismatch effects explained by the spectral model [MOS devices]. ICECS 1999: 1055-1058
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