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"Mismatch effects explained by the spectral model [MOS devices]."

Jürgen Oehm, Ulrich Grünebaum, Klaus Schumacher (1999)

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DOI: 10.1109/ICECS.1999.813415

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

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  dblp key:
  - conf/icecsys/OehmGS99
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  - https://dblp.org/rec/conf/icecsys/OehmGS99
Jürgen Oehm, Ulrich Grünebaum, Klaus Schumacher:
Mismatch effects explained by the spectral model [MOS devices]. ICECS 1999: 1055-1058

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