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"Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology."

Rafael N. M. Oliveira, Alan D. Lüdke, Cristina Meinhardt (2019)

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DOI: 10.1109/ICECS46596.2019.8964801

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/icecsys/OliveiraLM19
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  - https://dblp.org/rec/conf/icecsys/OliveiraLM19
Rafael N. M. Oliveira, Alan D. Lüdke, Cristina Meinhardt:
Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology. ICECS 2019: 590-593

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