"Investigation of on-chip PLL irregularities under stress conditions - case ..."

Yoav Weizman et al. (2004)

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DOI: 10.1109/ICECS.2004.1399750

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Yoav Weizman, Yefim Fefer, Sergey Sofer, Ezra Baruch:
Investigation of on-chip PLL irregularities under stress conditions - case study. ICECS 2004: 591-594

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