"Through silicon via to FinFET noise coupling in 3-D integrated circuits."

A. Rouhi Najaf Abadi et al. (2015)

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DOI: 10.1109/ICICDT.2015.7165916

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-01

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A. Rouhi Najaf Abadi, W. Guo, X. Sun, K. Ben Ali, Jean-Pierre Raskin, Martin Rack, C. Roda Neve, M. Choi, V. Moroz, Geert Van der Plas, Ingrid De Wolf, Eric Beyne, Philippe P. Absil:
Through silicon via to FinFET noise coupling in 3-D integrated circuits. ICICDT 2015: 1-4

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