"Assessing device reliability through atomic-level modeling of material ..."

Gennadi Bersuker (2014)

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DOI: 10.1109/ICICDT.2014.6838622

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Gennadi Bersuker:
Assessing device reliability through atomic-level modeling of material characteristics. ICICDT 2014: 1-3

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