"Highly reliable anti-fuse technology in sub-16nm technologies for security ..."

Rick Shih-Jye Shen, Hsin-Ming Chen, Meng-Yi Wu (2016)

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DOI: 10.1109/ICICDT.2016.7542060

access: closed

type: Conference or Workshop Paper

metadata version: 2018-03-15

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Rick Shih-Jye Shen, Hsin-Ming Chen, Meng-Yi Wu:
Highly reliable anti-fuse technology in sub-16nm technologies for security applications. ICICDT 2016: 1-4

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