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"Patterned Fabric Defect Detection using a Motif-Based Approach."

Henry Y. T. Ngan, Grantham K. H. Pang, Nelson H. C. Yung (2007)

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DOI: 10.1109/ICIP.2007.4379085

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-24

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Henry Y. T. Ngan, Grantham K. H. Pang, Nelson H. C. Yung:
Patterned Fabric Defect Detection using a Motif-Based Approach. ICIP (2) 2007: 33-36

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