"General Model for Manufacturing Defect Detection Crossing Multiple Products."

Longfei Zhou et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ICMLA58977.2023.00241

access: closed

type: Conference or Workshop Paper

metadata version: 2025-08-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icmla/ZhouQXLCLYLLSHH23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icmla/ZhouQXLCLYLLSHH23
Longfei Zhou, Zhanghao Qin, Ping Xia, Jiabao Liu, Weihao Cheng, Yunwei Li, Leyi Ying, Qian Liu, Mengxin Liu, Gezhang Song, Zebo Huang, Zhou Hao:
General Model for Manufacturing Defect Detection Crossing Multiple Products. ICMLA 2023: 1595-1600

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.