"Reduction of the Test Time for Mass Produced LSI Devices by Genetic ..."

T. Iwamoto et al. (1997)

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type: Conference or Workshop Paper

metadata version: 2019-04-09

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T. Iwamoto, S. Kobashi, Narumi Sakashita, J. Mitsuishi, Ken-ichi Tanaka, Kazuo Kyuma:
Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms. ICONIP (1) 1997: 704-707

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