"Measurement-Based Analysis of Multiple Latent Errors and Near-coincident ..."

Subhasish G. Mitra, Ravishankar K. Iyer (1988)

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type: Conference or Workshop Paper

metadata version: 2014-07-28

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Subhasish G. Mitra, Ravishankar K. Iyer:
Measurement-Based Analysis of Multiple Latent Errors and Near-coincident Fault Discovery in a Shared Memory Multiprocessor. ICPP (1) 1988: 404-409

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