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"Embedded Vision Solution for Defect Detection and Counting in Industry 4.0."

Lassaad Zaway et al. (2023)

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DOI: 10.1109/ICSC58660.2023.10449780

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-13

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  dblp key:
  - conf/icsc2/ZawayKAJT23
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  - https://dblp.org/rec/conf/icsc2/ZawayKAJT23
Lassaad Zaway, Jalel Ktari, Nader Ben Amor, Mohamed Jallouli, Maher Talmoudi:
Embedded Vision Solution for Defect Detection and Counting in Industry 4.0. ICSC 2023: 444-448

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