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"Improving test suites for efficient fault localization."

Benoit Baudry, Franck Fleurey, Yves Le Traon (2006)

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DOI: 10.1145/1134285.1134299

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Benoit Baudry, Franck Fleurey, Yves Le Traon:
Improving test suites for efficient fault localization. ICSE 2006: 82-91

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